Volume 6, Issue 5, September 2018, Page: 72-77
Holography of the Surface Layer in the Visible Range of Electromagnetic Radiation for Its Geometric Modeling
Evgeny Alexandrovich Belkin, Department of Experimental and Theoretical Physics, Faculty of Physics and Mathematics, Orel State University I. S. Turgenev, Orel, Russia
Vyacheslav Nikolaevich Poyarkov, Department of Experimental and Theoretical Physics, Faculty of Physics and Mathematics, Orel State University I. S. Turgenev, Orel, Russia
Oleg Ivanovich Markov, Department of Experimental and Theoretical Physics, Faculty of Physics and Mathematics, Orel State University I. S. Turgenev, Orel, Russia
Received: Aug. 22, 2018;       Accepted: Oct. 5, 2018;       Published: Nov. 6, 2018
DOI: 10.11648/j.ijsts.20180605.11      View  59      Downloads  8
Abstract
One of the main problems of modern measurement technology and Metrology is that no non-destructive testing device, due to its design features, allows to make metrological measurements necessary for the construction of a three-dimensional geometric model of the part surface, which is a superposition of the geometric image of the surface and the topography of its microrelief. As a rule, in the calculation of the forming surface of the tool there is no calculation of the topography of its microrelief. This is due to the lack of sufficient information about the geometric structure of the microrelief as a three-dimensional image, due to the use of one-dimensional evaluation parameter. Application for geometric modeling of the microrelief shape of a one-dimensional evaluation parameter-the height of the microrelief, gives an idea of the microrelief as a surface with numerical marks. In the description of the surface with numerical marks, the curvature in the local neighborhood of the given point is not determined, which makes it impossible to construct its full geometric image. The solution to the problem is to create a non-destructive testing device-an optical profilograph, the design of which would allow to measure the geometric characteristics of the surface of the part necessary for structuring its full geometric image and the development of a new geometric approach that allows to obtain this complete geometric image of the part. Installation - optical profilograph refers to measuring equipment, in particular to devices for roughness control. This installation is designed as a complex of non-destructive testing devices of new generation, which is aimed at solving the actual problem in the conduct of metrological measurements required to build a three-dimensional geometric model of the surface of the part, which would be a superposition of the geometric image of the surface of the part and the topography of its microrelief. The principle of operation of the installation is that the holographic image of the part, the scanning indicator of the electromagnetic field are removed cards, which are fixed microrelief profiles of the surface layer, profiles of internal and external surfaces of the part. With these profiles remove the geometric characteristics, which are based on the modular geometric approach allows you to structure the topography of the surface layer microrelief, as well as the internal and external geometry of the surfaces of the part, having a complex shape.
Keywords
Optical Profilograph Plant, Optical Circuits of Leith-Upatnieks and Denisyuk, Surface Layer Topography
To cite this article
Evgeny Alexandrovich Belkin, Vyacheslav Nikolaevich Poyarkov, Oleg Ivanovich Markov, Holography of the Surface Layer in the Visible Range of Electromagnetic Radiation for Its Geometric Modeling, International Journal of Science, Technology and Society. Vol. 6, No. 5, 2018, pp. 72-77. doi: 10.11648/j.ijsts.20180605.11
Copyright
Copyright © 2018 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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